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ALKA-TEX .FREE

IPA-free additive to improve the texturing quality of monocrystalline Si-wafers

ALKA-TEX .FREE

Compared with the standard process, ALKA-TEX .Free shows a homogeneous pyramid structure which enables higher efficiencies.

WIS-UNIT

The new WIS-UNIT is a stand-alone inspection system for reliable quality control of wafers

WIS-UNIT

Wafer leaving surface inspection bottom

STAB-TEST

The new STAB-TEST is an innovative lab tool for testing the stability of solar wafers and cells, determining the cell bow and measuring adhesion forces of the tabbing

STAB-TEST

Testing stability of solar wafers and cells via 4-Point Bend-Test

GP TOPO-D .Scan

用於檢測矽片和電池片3D缺陷全區域拓撲圖測量的在線檢測系統

TOPO-D

矽片的全區域拓撲圖測量可在一秒鐘的周期內高精度小於5微米的找出粗糙度處和鉅痕