Save Resources and Improve Yield
Requirements & Targets
High quality requirements for solar wafers:
- Need for high quality wafers for high effi ciency cells
- Zero tolerance for chippings and stains that deteriorate the optical impression of the cell
- Zero tolerance for edge breakage – no market for broken cells
Inspection Solution
SOLARSCAN-WAF-Q:
- Matrix camera technology for easy integration and optimum inspection results
- Resolutions down to 25 μm for ideal defect detection at Cycle times < 1 sec
- Patented ISRA / GP Dome technology with isotropic and chipping illumination for highest detection rate and lowest false rejects
- Multi-Image processing for detection of chippings, surface stains and edge breakage
- Calibration concept designed for easy line-to-line recipe transfer (copy-exact)
System Application
Incoming wafer inspection in-line
- Inspect incoming wafers for surface defects, contour breakage and correct metrology
- Quality grading of wafers and sorting of material not compliant with quality requirements
- 100 % control of each solar cell - 100 % defect detection
Benefi ts for Production
Invest now into your key to cost saving and improved quality:
- Robust and reliable detection and sorting of all relevant defects prior to processing
- Reduce scrape rate and increase production yield by sorting out of defective material
- Reclaim contaminated material, and get refuded from the supplier through documented proof of contaminated material