Situation
Finished solar cells are divided into various classes for optimal use of each cell’s potential later on in the module. GP CELL-Q .Cam classifies solar cells based on their optical characteristics. Each individual cell is precisely checked by a system for front and a system for back classification, the GP CELL-Q FS .Cam and the GP CELL-Q RS .Cam. Visually sound cells are reliably allocated to Quality Class A, whereas defective products are carefully rejected.
Principle
- Optical inspection system
- FS model: Color and print classification (combines the function of GP COL-Q .Cam and GP Print-Q .Cam)
- Stop measurement
Advantages
- Complete optical quality control of a solar cell
- Central recipe management and “copy-exact” process
- Simple and fast calibration option
- Constant calibration control
Technical Data
Topic |
Description |
Samples to be measured |
- Mono- and multicrystalline solar cells - Square or pseudo square - Textured or non-textured |
Wafer size |
100 … 156 mm |
Measured features |
Print positions, surface defects, coating thickness, coating thickness variance, separate treatment of coating at wafer edges, edge lengths, rectangularity, diagonals, phase lengths and angle, chipping, V-breaks, intrusion length and depth, surface defects |
Minimum cycle time |
1 s |
Machine interface |
- Parallel I/O - Parallel I/O (combined with RS232 for WaferID info) - Profibus |
Data interface (to factory |
XML via TCP/IP |
GP CELL-Q FS .CAM |
Front side classification |
Camera model |
4M / Matrix |
Defect resolution |
80 µm / 60 µm / 40 µm |
Stand Still time |
180 ms / 180 ms / 180 ms |
GP CELL-Q RS .CAM |
Back side classification |
Camera model |
1M / Matrix |
Defect resolution |
160 µm / 80 µm |
Stand Still time |
50 ms / 100 ms |
Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.
User Interface
GP CELL-Q has reliable and sensitive error detection thanks to a very high homogeneity factor, which generates a very homogeneous picture without any darkening around the edges. That ensures accurate detection of the smallest faults both in the center and at the edges of the cell with a high degree of repeat accuracy.
