Situation
Ideally, finished solar cells have to absorb as much light as possible, and at the same time have low reflection. To make that possible, antireflective coating is applied to cells during production to reduce optical losses. It is essential to check the thickness and texture of the coating meticulously. GP COL-Q .Cam and GP COL-Q .Scan dependably identify surface defects, such as color irregularities and color defects and carefully reject affected cells.
Principle
- Optical inspection system
- .Cam model for stop measurement
- .Scan model for measurement on-the-fly
Advantages
- Tailored to the needs of gigawatt production lines and large turnkey dealers
- Independent of the coating process and automation
- Central recipe management and “copy-exact” process
- Simple and fast calibration option
- Constant calibration control
Technical Data
Topic |
Description |
Samples to be measured |
- Mono- and multicrystalline wafers - Square or pseudo square |
Wafer size |
100 … 156 mm |
Camera model |
2K / Linescan |
Defect resolution |
80 µm / 160 µm |
Measured features |
Coating thickness, coating thickness variance, separate treatment of coating at wafer edges, color value |
Stand Still time |
25 ms (.Cam) |
Maximum belt speed |
400 mm/s (.Scan) |
Minimum cycle time |
1 s |
Machine interface |
- Parallel I/O - Parallel I/O (combined with RS232 for WaferID info) - Profibus |
Data interface (to factory |
XML via TCP/IP |
Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.
User Interface
The GP COL-Q .Cam system (stop-and-go measurement) and COL-Q .Scan (on-the-fly measurement) can detect surface defects, such as color irregularities and defects, dependably and with high stability using the highly sensitive GP Color Detection ModeTM in connection with the GP Light DomeTM.
