The functional principle of a solar cell invariably includes doping to form an n-type layer on top of a p-type wafer. This pn-junction is produced by diffusing an emitter on the front and back of the solar cell. Afterwards, the edges are isolated to prevent a short circuit in the cell. This is usually done by lasers or through etching processes. The ISO TEST Inline accurately and reliably tests edge isolation by wet chemical etching or plasma etching directly following the diffusion process.

• Inspection of the front emitter
• Tests resistivity and the diode characteristic between the front and back of the cell

• Finds possible defects in the edge-isolation process
• System to check results of plasma etching and wet chemical etching processes

Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.