GP 4-TEST Pro
Characterisation system for sheet resistance, specific, contact, and line resistivity of wafer and cells
overview

Situation

In-line and off-line process controls let you rapidly identify and eliminate any problems that may arise. The GP 4-TEST Pro is a lab instrument, which combines several versatile applications. It accurately measures the emitter sheet resistance as well as line and contact resistance of the fingers. That makes the GP 4-TEST a reliable instrument for monitoring the diffusion, screen printing and firing processes. Since this device also determines resistivity, it can also classify input material.

Principle

  • 4-point measuring system
  • Tungsten carbide or rhodium coated test probes are available
  • Transfer length method (TLM) used to determine contact resistance

Advantages

  • Performs all types of resistance measurements
  • High quality test probes for every application
  • Keithley instruments for measuring electronics
  • User-friendly software with extensive evaluation options
  • MES interface for extended applications

Technical Data

Topic

Description

Samples to be measured

- Mono- and multi-crystalline wafers

- Square or pseudo square

- Textured or non-textured surface

- Diffused layer (n+p or p+n)

- Edge isolated (plasma or single-side wet chemical)

Wafer size

125 … 210 mm

Total cycle time

approx. 10 sec

System layout

Measurement stage, measurement electronics and controller PC integrated in transportable 19” rack.
Industrial keyboard with integrated trackball, 17” TFT

Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.