GP SR-TEST
System for measuring the spectral sensitivity of solar cells and determination of reflection as a point measurement or surface scan
overview

Situation

A solar cell's performance is fundamentally dependent upon its electronic characteristics. These cell characteristics are tested in order to classify cells and to locate problems in processes. That includes measuring quantum efficiency, from which conclusions about the complete manufacturing process can be drawn. The GP SR-TEST precisely and reliably measures solar cell external quantum efficiency (EQE) and surface reflection, which it uses as a basis to calculate internal quantum efficiency (IQE). This helps to gain a more clear understanding of loss-causing influences which limit cell performance.

Principle

  • EQE and IQE are calculated
  • 4-point scheme, including contact quality control

Advantage

  • Measurement of reflection and short-circuit current based on wavelength

Technical Data

Topic

Description

Measurement

- Parallel beam hits cell through 2 x 2 cm² aperture

- White bias light up to 1.3 suns restricted to aperture area

- Scanning system: EQE/R/IQE measured as average on full cell area

- movement of solar cell in x-y with up to 200 mm/s

System features

- Outstanding S/N ratio, with and without BIAS light

- Fast local measurements on large cells

- Compact setup

- Low thermal budget

Measurement Duration

For local EQE or REF measurement with
90 wavelengths < 4 min

Per wavelength scanning with 100mm/s:
125 x 125 mm²   <  9 s
256 x 156 mm²   <  13 s
210 x 210 mm²   <  24 s

Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.