Situation
One of the greatest challenges facing modern solar cell production is combining high throughput with low breakage rates. As a lab device, GP STAB-TEST Pro meticulously tests the mechanical stability of wafers and cells, making it possible to reliably isolate the cause of increased breakage rates in production. Equipped with optional features, the GP STAB-TEST Pro can also measure adhesion forces on soldered tabbing and the degree of cell bow after firing.
Principle
- Calibrated force sensors combined with high quality Keithley multimeters
- Twist testing to simulate wafer strain during the screen printing process
Advantages
- Greater measurement range to measure breakage force
- Determines the causes of increased breakage rates in production, helping to reduce the breakage rate
Technical Data
Topic |
Description |
Samples to be measured |
- Mono- and multi-crystalline wafers/cells - Square or pseudo square |
Wafer sizes |
100 … 210 mm |
Measurements |
- Stability measurement with force limit, stability limit, force/stability limit, or breakage force/displacement - Adhesion testing - Bow testing |
Force accuracy |
+/- 10 mN |
Displacement Resolution |
+/- 5 µm |
Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.