PV WAFER INSPECTION
Integrated inspection systems for early detection of various wafer defects in PV production
-
GP WISFully integrated wafer inspection system for complete quality control

-
GP TEST-UNITCompact test and sorting unit for single mesuring systems

-
GP WAF-Q .CamInline vision inspection module for as-cut wafers

-
GP NANO-D .ScanInline vision inspection module for micro crack detection

-
GP TOPO-D .ScanFull-area topographic measurement to detect 3D defects

-
WAF INSP TTVInline thickness, TTV, specific resistance and bow measuring system WMT/WLT

-
IN-LIFEInline Lifetime Characterisation System WML/WLL












































































