PV WAFER INSPECTION
Integrated inspection systems for early detection of various wafer defects in PV production
  1. GP WIS
    Fully integrated wafer inspection system for complete quality control
  2. GP TEST-UNIT
    Compact test and sorting unit for single mesuring systems
  3. GP WAF-Q .Cam
    Inline vision inspection module for as-cut wafers
  4. GP NANO-D .Scan
    Inline vision inspection module for micro crack detection
  5. GP TOPO-D .Scan
    Full-area topographic measurement to detect 3D defects
  6. WAF INSP TTV
    Inline thickness, TTV, specific resistance and bow measuring system WMT/WLT
  7. IN-LIFE
    Inline Lifetime Characterisation System WML/WLL