Situation
The best solar cells are produced from the best wafers. GP WAF-Q .Cam is an innovative inspection system that reliably finds visual defects on as-cut wafers, regardless of whether they are surface contaminations, chipped edges, V-shaped breaks, chippings or geometric defects. GP WAF-Q .Cam then classifies the wafers into different quality categories according to their geometric and optical properties.
Principle
- Optical measurement process
- Stop-measurement
Advantages
- Reliable and reproducible detection of defects on as-cut wafers
- Quick feedback
- Central recipe management and "copy-exact" process
- Simple and fast calibration option
- Constant calibration control
Technical Data
Topic |
Description |
Samples to be measured |
- As-cut mono- and multicrystalline wafers - Square or pseudo square |
Wafer size |
100 … 156 mm |
Camera model |
4M Matrix |
Defect resolution |
80 µm / 60 µm |
Measured features |
Edge lengths, rectangularity, diagonals, phase lengths and angle, chipping, V-breaks, intrusion length and depth, surface defects |
Stand Still time |
25 ms / 25 ms |
Minimum cycle time |
1 s |
Machine interface |
- Parallel I/O - Parallel I/O (combined with RS232 for WaferID info) - Profibus |
Data interface (to factory |
XML via TCP/IP |
Note: All technical details are subject to change without prior notice. Only technical specifications contained in an offer are binding.
User Interface
The GP WAF-Q .Cam reliably detects all visual defects with a significant reduction of crystal structures. The GP Solar Inspect software suite offers precise and flexible defect classification, making it easy to apply inspection criteria to the system.
