Logo ISRA VISION AG
Press Material
HERE YOU CAN FIND INFORMATION AND GRAPHICAL MATERIAL FOR FREE EDITORIAL USAGE REFERRING TO THE SOURCE.

ALKA-TEX .FREE

IPA-free additive to improve the texturing quality of monocrystalline Si-wafers

ALKA-TEX .Free

Compared with the standard process, ALKA-TEX .Free shows a homogeneous pyramid structure which enables higher efficiencies.

WIS-UNIT

The new WIS-UNIT is a stand-alone inspection system for reliable quality control of wafers

WIS-UNIT

Wafer leaving surface inspection bottom

STAB-TEST

The new STAB-TEST is an innovative lab tool for testing the stability of solar wafers and cells, determining the cell bow and measuring adhesion forces of the tabbing

STAB-TEST

Testing stability of solar wafers and cells via 4-Point Bend-Test

TOPO-D

Inline inspection system for full area topographic measurement to detect 3D defects in wafers and solar cells

TOPO-D

Full-area measurement of topography of solar wafers to find roughness and saw marks with high accuracy (< 5µm) in one-second cycles