Defect busterpv magazine 06-2010 Process-control tools: The rise of thin film manufacturing is fueling a growing demand for metrology and in-line process-control tools. But what tools are necessary and whether the investments will pay off is a matter of debate. |
|
Monitoring a whole production linepv magazine 04-2010 GP Solar's Soft View Tool checks the quality of wafers and cells at several test points along the production line. The information it gathers is displayed on screen, so production managers and quality engineers can reat quickly to errors. The Soft View Tool consists of a server system that captures information in real time and then converts it to web views. GP Solar also released a Central Recipe Tool. A recipe lists individual measuring and sorting tasks in a defined order. The tool serves for managing recipes on a separate server at higher level, so that different production facilities can import the identical measuring and sorting tasks and achieve the same level of quality. |
|
On a gigawatt coursepv magazine 12-2009 Large-scale factories: Production facilities for photovoltaic cells are constantly growing in order to drastically reduce manufacturing costs. But this growth has its limits, and not just because of high investments costs. The local market has to be able to handle the huge cell volumes. |
|
Measurements with X-ray visionpv magazine 09-2009 GP Solar has developed the GP NANO-D optical measurement system to detect cracks, inclusions, and other defects in wafers. This patent-pending process inspects wafers with light. The company says that the error rate is nearly zero, makting further inspection of the rejected wafers unnecessary. The GP NANO-D can inspect a 100 to 156-millimeter wafer in one second. The GP NANO-D can be used for quality control in wafer manufacturing for receiving inspection, an das a process control after wafer coating. |
|
Preview 24. EU PVSECSUN WIND & ENERGY 09-2009 Trust is good, control is better: GP Solar is presenting in Hamburg a new inline system for optically inspecting wafers. The GP-Nano-D checks the raw material for microcracks, holes and other defects. It thus provides quality control for contacting the wafers. The goal is to considerably reduce breakage rates in the production lines. The GP Nano-D is suitable for mono- and multicrystalline wafers and has a throughput of around one wafer per second. The company ,which belongs to the Centrotherm Group, is also presents its GP M-Connect junction box. With the 4-pole system, the junction contacts are located in a laminated flat component and are fixed using a spring clamp unit. All junction box components can be assembled automatically and manually. The product will be sold as of GP Solar’s turnkey projects or under a licence agreement with a module manufacturer. |
|